Abstract
The paper reports the analytical model for the analysis of the effects of channel doping on the threshold voltage. A silicon germanium p-MOSFET with high-k dielectric material along with a metal gate is used for the analysis. The presented model considers the short channel effects, junction depth, doping of the layers and metal gate work function. Results are validated with the 22 nm device geometry. The MOSFET with reduced channel doping reflects the corresponding reduction in the threshold voltage. The model can effectively analyze the SiGe p-MOSFET for device designing in the nanometer regime.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
