Abstract
Magnetic microstructural information of the stray field of a recording head may be obtained by Lorentz microscopy. This involves measuring the deflection, due to the Lorentz force, experienced by an electron as it passes through the stray field. Using a simplified model of a head, an analytical solution has been derived that gives the integrated Lorentz force experienced by an electron as it passes through the stray field of a thin-film recording head. >
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
