Abstract
We present an analytical thermal model to explain the crosstalk in YBCOedge-transition bolometer arrays. The verification of the model wastested on sample array devices made of 200 and 400 nm YBCO films onLaAlO3 and SrTiO3 substrates. The model presented was able to explain the effects of the various physicalparameters of the devices, such as the film thickness, operating temperature, and the deviceseparation, which cause different response behaviours based on the variation of the relatedthermal crosstalk characteristics. In addition, the model is valid above the crosstalk-freemodulation frequencies, where the effects of the thermal crosstalk on the response of thedevices are negligible.
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