Analytical Model of an E-core Driver-pickup Coils Probe Applied to Eddy Current Testing of Multilayer Conductor

Abstract

An analytical model of an E-core driver-pickup coils probe located above a multilayer conductor containing a hidden cylindrical conductor is presented. The truncated region eigenfunction expansion (TREE) method is used to deal with the axial symmetry problem, and the closed-form final expression of the induced voltage in the pickup coil is derived. The changes of the induced voltage in the pickup coil due to the hidden cylindrical conductor are examined and calculated in Mathematica. Experiments and finite element simulations are performed and the results are compared with the analytical results, and they are in good agreement.