Abstract
It is known that when the electric double layers (EDLs) overlap, the ionic conductance in a nanochannel depends substantially on its surface charge property. Considering growing modern applications of nanochannel devices and demand of fast analysis, we for the first time develop an exact analytical model, referred to as the simplified analytical truncated model (ATM), for estimating the surface-charge-governed nanochannel conductance in the region of EDL overlap by taking into account the practical effects of the Stern layer, the existence of multi-component ionic species, surface site dissociation/association equilibrium reactions, and electroosmotic flow. Note that the derived ATM is suitable for long nanochannels and symmetric electrolytes. The present ATM is validated by excellent agreement with not only the reported full analytical multi-ion model but also existing experimental data of nanochannel conductance in the regime of overlapped EDLs. Results show that the developed ATM is capable of explicitly predicting the surface-charge-governed nanochannel conductance at any levels of pH under the condition of highly overlapped EDLs. The validated ATM provides a very useful receipt for experimentalists and is applicable to the design of next-generation nanochannel devices.
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