Abstract

An analytical method has been developed for the detection of SiO2 and other oxides in titanium dioxide and certain silicates used in food additives using inductively coupled plasma (ICP) atomic emission spectrometry without hydrofluoric acid. SiO2 and other oxides in titanium dioxide or certain silicates were resolved by alkali fusion with KOH and boric acid and then dissolved in dilute hydrochloric acid as a test solution for ICP. The recovery of SiO2 and Al2O3 added at 0.1 and 1.0%, respectively, in TiO2 was 88–104%; coefficient of variation was <4%. The limit of determination of SiO2 and Al2O3 was about 0.08%, and the accuracy of the ICP method was better than that of the Joint FAO/WHO Expert Committee on Food Additives (JECFA) test method. The recovery of SiO2 and other oxides in silicates was 95–107% with a coefficient of variation of <4%. Using energy dispersive X-ray fluorescence spectrometry (EDX) with fundamental parameter determination, the content of SiO2 and other oxide in titanium dioxide and silicate showed good agreement with the ICP results. ICP with alkali fusion proved suitable as a test method for SiO2, Al2O3 and other oxides in titanium dioxide and certain silicates, and EDX proves useful for screening such impurities in titanium dioxide and componential analysis of certain silicates.

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