Abstract
An efficient analytical model has been developed for predicting the electromagnetic leakage field coupling with a lossless two-conductor transmission line (TL) through covered apertures of multiple enclosures. The analytical results have been successfully compared with those from the full-wave simulation software CST over a broad frequency range. The analytical model can be employed to analyze the effect of different factors including the position and the direction of the electric dipole, the conductivity of the conductive sheet, the quantity of the aperture, and the direction of the TL on the induced currents. Besides, it can also deal with apertures in multiple sides of the enclosures.
Highlights
Due to the increasing complexity and density of high speed integrated circuits and electronic devices, the problems of electromagnetic interference (EMI) have become considerably common and severe
The electromagnetic field coupling with wires, an indispensable part of electronic systems used for circuital connection and signal transmission, has attracted much more attention in circuit related EMI problems [4,5,6,7]
The transmission line (TL) is located in a metallic rectangular enclosure, and the leakage field is excited by an electric dipole inside another adjacent metallic rectangular enclosure with an aperture covered by a conductive sheet
Summary
Due to the increasing complexity and density of high speed integrated circuits and electronic devices, the problems of electromagnetic interference (EMI) have become considerably common and severe. Due to the rapid development of material science and technology, an increasing number of conductive materials with good flexibility and low weight have been used in the design of shielding enclosures [12, 13] Sometimes, they are employed to close apertures to improve the shielding effectiveness of an enclosure [9]. An efficient analytical model has been proposed for predicting the electromagnetic leakage field coupling with a lossless two-conductor TL through covered apertures of multiple enclosures. The TL is located in a metallic rectangular enclosure, and the leakage field is excited by an electric dipole inside another adjacent metallic rectangular enclosure with an aperture covered by a conductive sheet. It should be noted that the reradiated field created by the TL has been ignored in the proposed model
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