Analytical expression of habit plane in crystalline materials by double non-Edge-On tilting (DNEOT) method

Abstract

Phase boundary and grain boundary play an important role in tuning the mechanical properties of engineering materials and physiochemical properties of functional materials. A few quantitative or semi-quantitative methods have been reported to show their applicability in interface and/or phase/grain boundary measurement. However, these methods fall into the difficulty of either computational complexity or the assistance of other technique. This work introduces a systematic tilting method for determination of habit plane in crystalline materials and provides an analytical expression of planar Miller index. This method is not related with specimen thickness, Kikuchi line or orientation map, and universal for general planar defects with parallel or non-parallel traces. A comparison with various methods is also discussed.