Abstract
Periodic multilayer structures of quarterwave and multiple quarterwave stacks with shifted ratios of high and low index layers in the half-wave pairs are considered. Analytical dependencies of the reference wavelength reflectance and the width of high reflectance zone on the number of layers, fraction quarterwave and layer refractive indices are obtained. The structures are used as starting designs for notch filters. Obtained dependencies allow one to estimate in advance parameters required to achieve target spectral characteristics.
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