Abstract
The scanning mobility particle sizer (SMPS) is a key instrument for aerosol studies that enables rapid measurement of particle size distribution. When SMPS data are inverted, the smearing effect needs to be considered. Previous studies used numerical methods to deconvolute the smearing effect. In this paper, to reduce the complexity of SMPS data inversion, we derive an analytical formula for de-smearing, and include our de-smearing formula into a full SMPS data inversion scheme. We also propose the voltage step change experiment to characterize the smearing effect of an SMPS. The effectiveness and robustness of our de-smearing approach were demonstrated using experimental data.
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