Analytical Crosstalk Modelling of On-Chip RLC Global Interconnects with Skin Effect for Ramp Input

Abstract

This paper proposes a much improved, accurate, fast and simple crosstalk model for coupled interconnect line considering the skin effect. It is time for VLSI designers to examine the crosstalk noise effects in their designs, so that they are free from noise. Hence, accurate noise modelling for RLC lines is critical for timing and system integrity analysis. Skin effect alters the values of the resistance and also the inductance, which in turn affects the system integrity in particular and its response as a whole. Till now the skin effect has been neglected for modelling the on-chip interconnects. This paper addresses a novel analytical model to find the impact of skin effect on the noise variation in RLC interconnect, without considering the skin effect modelling in inductance under ramp input. In the proposed work, the resistance variation due to the skin effect is considered in a two wire transmission line model. The correlation between the skin effect and noise is also considered.