Abstract
The effects of an edge-located electromagnetic bandgap (EL-EBG) structure including a defected ground structure (DGS) on the cavity-mode resonances of power/ground planes are analyzed for the power integrity design of high-speed packages and printed circuit boards (PCBs). The EBG structure localized in the power/ground planes significantly affects the power integrity characteristics. However, previous studies did not consider this effect. An analytical equation and a numerical method based on the contour integral method (CIM) are developed to examine the EL-EBG effect on cavity-mode resonance. The proposed method reveals that the employment of the EL-EBG structure results in resonance frequency reduction, generation of hybrid-type mode, irregular relationship between mode resonance frequencies, and different distribution of mode intensity compared to conventional open-ended power/ground planes. The proposed CIM modeling and analysis for investigating the distinctive features of the EL-EBG effect are validated using full-wave simulations and measurements. The rigorous analysis of the EL-EBG effect enables the improvement of power integrity design for power/ground planes combined with EBG structures. Moreover, the proposed CIM modeling can obtain fast and accurate results for EL-EBG power/ground planes compared to full-wave simulations.
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