Abstract

Ultra-precision measurement systems are important for semiconductor manufacturing processes. In a phase grating sensing alignment (PGA) system, the measurement accuracy largely depends on the intensity of the diffraction signal and its signal-to-noise ratio (SNR), both of which are associated with the grating structure. Although an equally segmented grating structure could increase the signal of a high odd order, it could also strengthen the signals at the zeroth and even orders which are the main contributors of stray light. This paper focuses on the practical problem of differently responding diffraction orders but in one grating structure. An analytical relationship has been established between the diffraction efficiency and the segment structure of phase grating. According to this analytic model, we then propose a design method to increase the diffraction signal at high odd orders and, meanwhile, to decrease it at the zeroth and even orders. The proposed method provides a fast and effective way to obtain the globally optimal grating structure in the valid scope. Furthermore, the design examples are also verified by means of numerical simulation tool–rigorous coupled-wave analysis (RCWA) software. As a result, the proposed method gives insight into the diffraction theory of segmented grating and the practical value to greatly improve the design efficiency.

Highlights

  • Ultra-precision measurement systems play an essential role in cutting-edge technology and industrial process quality control [1]

  • Position error caused by lens aberration often accumulates to 1 nm which consumes a large part of the 4 nm overlay requirements of today’s alignment [5]

  • This kind of problem can be effectively solved by the other type of alignment sensing system, i.e., phase grating alignment (PGA)

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Summary

Introduction

Ultra-precision measurement systems play an essential role in cutting-edge technology and industrial process quality control [1]. Designing a grating structure with enhanced H-DLO and reduced DLZE at the same time is an interesting challenge for alignment sensing systems used in the IC industry. A segmented phase grating structure is designed to improve the light signals received at high odd orders [13,14,15,16,17]. We propose a design method for a phase grating structure based on scalar diffraction theory This method provides a fast and reliable way to find the most effective strategy that can tackle the practical problems of both H-DLO and DLZE at the same time. A design strategy of grating structures is developed with diffraction efficiency of the H-DLO increased and that of the DLZE decreased. 0 xi+1 with d/2 thxe odd order m enhanced

Eliminating Diffraction of Even Orders
G2 z G3
Optimizing the Groove Depth
Design Process of Segmented Grating
Designed Examples and Verification

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