Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane)

Abstract

The crystalline polysiloxane (—R2SiO—)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 • 0.01 and c = 9.40 ± 0.05 . The probable space group is P41 (or P43).