Abstract
A simple and fast computational method for analysing two-layer planar transmission lines is presented. This method is an extension of the point matching method used by Marcuse (1989). The calculated fields are used to estimate the characteristic impedance and the effective dielectric constant of the structure. The results agree well with the published data obtained using the spectral domain technique and the variational method. This method can be applied to analyse other coplanar lines for monolithic microwave integrated circuit (MMIC) applications.
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