Abstract
A novel white defect phenomenon, time-dependent white defect (TDWD), exclusively observed in 2-million-pixel photoconductive-layered solid-state image sensors has been studied. Experimental results and analytical models show that TDWDs are caused by Fowler-Nordheim injection of electrons through the oxide under the taper-etched cathode interface regions in vertical CCD registers.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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