Abstract
A simple expression for the noise factor of an avalanche photodiode (APD) operating in a charge-storage mode is derived. Calculated results for a crystalline silicon APD suggest that input shot noise could be reduced by the sublinear light-transfer characteristics of the APD, which are in good agreement with experimental results.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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