Abstract
The development of the smart grid requires the distribution switch to not be limited to the original breaking function. More functional requirements lead to more complex switch structures, especially the intelligent processing unit on the secondary side. A technology called primary and secondary integration optimizes the structure of the switch, which greatly increases the intelligence level of the switch, but also has disadvantages. The secondary intelligent unit is arranged close to the primary high-voltage electromagnetic environment, and the distribution switch is prone to failure due to electromagnetic interference. In order to explore the influence of electromagnetic interference on it, a transient electromagnetic interference simulation test platform was built for a 10 kV intelligent distribution switch based on the principle of spherical gap arc discharge, and the interference signal of the intelligent distribution switch was measured; the law of the spatial magnetic field near the electronic transformer is mainly studied in this paper. The shielding effectiveness of the distribution terminal of the switch was analyzed, and the interference of the power line of the sensor merging unit circuit board was calculated. The results show that the electronic transformer may have serious faults under continuous strong transient electromagnetic interference. The electromagnetic transient simulation test system studied in this paper can evaluate the anti strong electromagnetic interference ability of the electronic transformer.
Highlights
The electronic transformer and other secondary equipment in the primary and secondary integration distribution switch are closer to the high-voltage primary side and become a more integrated and standardized intelligent unit [1,2]
Since its formal application, electronic transformer faults caused by electromagnetic interference have occurred in many substations and distribution network stations [6]
The research of relevant scholars on the electromagnetic interference test method of primary and secondary integration distribution switches mainly focused on the conducted interference; that is, only the interference current or voltage measured on the conductor is analyzed
Summary
The electronic transformer and other secondary equipment in the primary and secondary integration distribution switch are closer to the high-voltage primary side and become a more integrated and standardized intelligent unit [1,2]. The research of relevant scholars on the electromagnetic interference test method of primary and secondary integration distribution switches mainly focused on the conducted interference; that is, only the interference current or voltage measured on the conductor is analyzed. In [16], the conducted interference signals at the secondary side of the sensor and the input of the feeder terminal unit (FTU) were measured, and the anti-lightning impulse circuit of the primary and secondary integration distribution switch was optimized. It is urgent to study the interference of the primary and secondary integration switch electronic transformer under the radiated electromagnetic field. The analysis of the disturbance of the electronic transformer on the distribution switch and further research on protection technology are promoted
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