Abstract
The results of computer simulation of interaction between the magnetic field of the surface eddy current probe and a conductive pipe performed in COMSOL Multiphysics were used to determine the dependences of the probe on major influencing factors: pipe wall thickness, the gap between the probe and the pipe surface, material electroconductivity, the pipe wall curvature, areas with a smooth V-shaped change in the thickness and local thinning of a spherical shape, misalignment of the probe axis relative to the pipe surface and transverse displacement of the probe axis.
Highlights
The advantages of the surface eddy current probe are their versatility, the ability to control objects of plane, cylindrical and complex forms with one-sided access to the test object, locality that provides high resolution and precise determination of the defect zone when scanning the surface of the test object [1,2]
With regard to the problem of interaction between the Surface eddy current probes (SECP) magnetic field and the conductive pipe, finite element method (FEM) allows the analysis of the effect of material conductivity σ, wall thickness T and the pipe outer diameter D, the gap between the SECP and the pipe surface y on the SECP output signal, but in contrast to the mentioned analytical models, it enables the analysis of the effect of linear x and angular α misalignment of the SECP and the pipe, non-uniform thickness and the presence of pipe wall local thinning
We studied the effect of V-shaped and local changes in the wall thickness on the SECP waveform
Summary
Surface eddy current probes (SECP) are widely used to solve various problems of non-destructive testing: measuring the thickness of electroconductive objects and non-conductive coatings on metal surfaces, control of metal and alloy electroconductivity, inspection of products of different shapes, structuroscopy of parts of non-magnetic and ferromagnetic alloys. One of the essential inspection problems efficiently solved via SECP is measuring the wall thickness of pipes made of electroconductive nonmagnetic material and the thickness of the dielectric coatings on these pipes or the air gap between the probe and the pipe surface.
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