Abstract
Results are presented from investigating active and drainage layers of composite films (membranes) UPM-50 and UPM-100 before and after exposure to transmembrane pressure by means of IR spectra of reflection, X-ray scattering, and raster electron microscopy. It is found that changes in the IR spectrum of the working sample are caused by the destruction of weak bonds of C=O···H–N amide fragments of the polysulfonamide film. A drop in (C=O) vibration frequency ν by Δν = 20 cm−1 indicates redistribution of the electron density between C=O-groups and benzene rings as a result of the inductive effect of coupling, which results in the formation of charged functional groups CO−. The presence of CO– groups fragments a new supramolecular structure whose stability due to the dipole–dipole interaction of carbonyl anions. X-ray scattering of the initial and working samples in the 10°–35° range of angles 2θ is determined by three intense reflections at angles 2θ ~ 17.23°, 22.24°, 25.41° from crystallographic planes ((010), (100), and (110)) corresponding to the crystalline structure of lavsan (polyethylene terephthalate). A comparative analysis of the reduced intensities of reflections from crystallographic planes (010), (100) and the sizes of lamellas indicates that transmembrane pressure initiates conformational rearrangement of crystallites with crystallographic axis b oriented parallel to the film plane.
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