Analysis of Texture Depth Distribution by Energy-Dispersive Diffraction

Abstract

Possibilities for depth resolving texture analysis applying energy-dispersive X-ray synchrotron diffraction are presented. Exploiting the advantage of having the complete diffraction spectra observed in a fixed but arbitrary measuring direction, two different approaches for high spatial resolution analyses are discussed. The first allows fast access of intensity distribution from plan families {hkl} parallel to the sample surface. The latter allows successful pole figure assessment despite the complex and time consuming slit alignment and data processing. The size of the sampling volume can be tailored to the sample problem ranging from 10 to 100 µm in height or more if necessary.