Abstract
Cell separation techniques based on dielectrophoresis are of high interest as an effective method of performing cell separation non-invasively on cells. However, dielectrophoresis devices have the problem that cells in the device are exposed to a high-temperature environment due to the generation of Joule heat caused by high-voltage application and dielectric-loss heat when the applied voltage is AC voltage. There is concern that the heat generated in the device may affect cell viability, cell cycle and apoptosis induction. In this study, the temperature field inside the dielectrophoretic cell separation device was experimentally and numerically investigated. The temperature rise at the bottom of the flow channel in the device was measured using the LIF method, and the thermofluidal behavior of the device was numerically simulated by adopting a heat generation model that takes the Joule and dielectric-loss heating into account in the energy equation. The temperature rise in the device was evaluated and the effect of the heat generation on cells in the device is discussed.
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