Abstract
The surface forces between a Si 3N 4 tip and sample surfaces of various oxides, such as SiO 2, SnO 2, and Al 2O 3 were measured in electrolytes with various pH values using atomic force microscopy. The isoelectric points were estimated from the force-distance curves. A similar treatment was applied to hydrocarbon-modified quartz surfaces. Almost no effect of the surface modification was found in neutral solutions, while a small difference in the force-distance curves before and after the modification was observed in acidic and alkaline solutions. The electric double layer force due to the concentration profile of the counterions at the oxide/water interface is discussed in terms of acid-base reactions of-OH groups on the oxide surface.
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