Abstract
In the field of silicon photonics, germanium (Ge) is an attractive material for monolithic light sources. Tensile strain is a promising means for Ge based light sources due to enhancing direct band gap recombination. We investigated strain engineering in Ge using silicon nitride (SiNx) stressors. We found that microfabricated Ge greatly improves the tensile strain because SiNx on the Ge sidewalls causes a large tensile strain in the direction perpendicular to the substrate. Tensile strain equivalent to an in-plane biaxial tensile strain of 0.8% at maximum was applied, and the PL emission intensity was improved more than five times at the maximum.
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