Abstract
The power supply noise of the voltage-controlled oscillator (VCO) directly affects the performance of the phase-locked loop (PLL). This study focuses on the single event effects (SEE) of supply regulated LC-tank VCO. The sensitive nodes in the low dropout regulator (LDO) and their causes are analyzed, meanwhile sensitive nodes in LC VCO are also analyzed. The circuit operating at 8.5 GHz was designed in a 28 nm CMOS process.
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