Abstract
According to the circuit structure and working principle of CMOS APSs, the single event effect and its producing mechanism are discussed in detail. Through a set of detailed experimental data and chart analysis, introduces a set of effective single event test methods for CMOS APSs. The experimental data and analysis results are not only helpful to improve the design of RHBD of CMOS APSs but also effectively carry out some research on ray monitoring and detection.
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