Abstract
The general principles of single- and double-crystal spectrometers are described using the three-dimensional DuMond diagram and new formulae for the resolution of the spectrometers are deduced. A method for measuring the fine structure of spectral lines with high precision is suggested and a generalized method of refraction correction is discussed. The Cu Kα line profile is measured carefully by double-crystal spectrometers using (nS, nS) and (nV, nR) arrangements, and a hump is found unambiguously on the long-wavelength side of the Cu Kα1 line.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
