Abstract
It is well known that a steel which is subjected to fatigue under severe conditions shows peculiar microstructures that are quite different from those of undeformed one or even one which is subjected to a conventional uniaxially deformation. This is particularly true in the case of a steel used in a ball bearing which is subjected to a rolling contact fatigue under severe conditions. The evolution of such a peculiar microstructure can induce flaking of the steel during rolling contact. Recently, a new technique called a focused ion beam (FIB) to prepare TEM specimens has been developed and applied widely to semiconducting materials. In this study the FIB technique was applied to examine by TEM a peculiar microstructure in a steel evolved during a rolling contact fatigue.
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