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Abstract
We consider the Mach-Zehnder interferometer (MZI) method that specifically uses a poled organic thin film as one of the reflective mirrors in order to characterize the two independent electro-optic tensor elements r(13) and r(33). We discuss both a simple analysis based on a three-layer structure and a rigorous method including multiple reflection effects in a multilayer structure. In doing so, we find that the simple analysis of the reflective MZI method yields identical results to the reflection ellipsometric method (simple Teng-Man method), first introduced by Teng and Man as well as Shildkraut in 1990, when the ratio of r(13) to r(33) obtained from the MZI method is used in the analysis of the simple Teng-Man method. Error introduced by ignoring the multilayer nature of the sample structures in the MZI method is discussed and corrections are given for previous expressions in the literature for the simple analysis.
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