Abstract
A formalism is presented which allows the quantitative evaluation of data from grazing-incidence small-angle neutron and X-ray scattering – GISANS and GISAXS – in the framework of the distorted wave Born approximation. While several aspects have been reported previously, this formalism combines solutions for scattering intensities in both reflection and transmission hemispheres, taking into account instrumental resolution effects. This formalism is applied to the case of GISANS from self-organized diblock copolymers, ordered in perpendicular lamellar structures on an Si wafer in randomly oriented short-range-ordered regions. The periodicity ofD= 85 (9) nm found for deuterated polystyrene–polybutadiene of molecular weight Mw= 165 kg mol−1and a molecular weight fraction of the deuterated polystyrene block of 52% is consistent with atomic force microscopy and specular neutron reflectivity results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
