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Abstract
: A two-dimensional formalism is provided for analyzing the probe-sample interaction of optical near-field images in transmission mode. The numerical simulation is performed on a dielectric surface with sub-wavelength structures. The constant-height, near-field intensity through two Gaussian ridges has been calculated for p-polarized incident light. The influence on the signal by the dielectric function of the probe, the size of the scatterers, and the angle of incidence is investigated. The passive probe model is compared when equipped with and without the tip and the near-field intensity is simultaneously calculated.
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Schedule a callMore From: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
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