Abstract
A series of poly(2-hydroxyethyl methacrylate) gels cross-linked with different concentrations of ethylene glycoldimethacrylate were examined by static secondary ion mass spectrometry (BIMB). Changes in the peak intensities of atomic versus molecular secondary ions were observed in negative ion BIMB as a function of cross-linker concentration. These changes in the distribution of secondary ions as a function of cross-linker concentration, and thus as a function of molecular weight between cross-links, are discussed with respect to the factors affecting secondary ion emission during the BIMB process. The sensitivity of static BIMB to the concentration of cross-links in the polymer chains on the surface of the polymer, demonstrated by this study, may advance the study of technologically relevant surface modifications involving surface cross-linking
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