Analysis of Physical Mark Length Variation for Write Strategy Optimization

Abstract

The physical mark length variation is analyzed to determine the relationship between write strategy parameters and measured mark runlength variation. A new approach is proposed to optimize the write strategy parameters on the basis of the mark runlength measurement. In this approach, multiple write strategy parameters are optimized simultaneously to reach the desired mark runlength target, thus the total data-to-clock jitter is minimized. The physical mark length variation caused by write strategy parameters is calculated on the basis of the mark runlength measurement. The experiments on high-speed phase-change recording verified the effectiveness of the optimization algorithm.