Abstract

AbstractThe energy dispersive X‐ray microanalysis in combination with the scanning electron microscopy was used for investigations of the microdistribution of Pb dopants in solution‐grown KCl crystals. In applying an absorption filter technique (using an about 30 μm thick aluminium foil arranged into the X‐ray path between the specimen and the detector) the resulting detectability of the Pb minor constituents is improved by a factor of about 3. The minimum detectable content of lead within the KCl matrix could be estimated to have the order of magnitude of 0.1 mole per cent Pb.

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