Abstract
A numerical study of the effect of high power levels, at wavelength of 0.85 μm, on the characteristics of LiNbO 3 tapered optical couplers is reported. Some optically induced drift phenomena of the power exchange between the tapered couplers or nonparallel waveguides are revealed and discussed. In addition, we also evaluate the dependence of the photorefractive sensitivity on the slowly tapered function. Based on novel numerical results, the appropriate tapered structure can be used to improve the photorefractive degradation. A further reduction of the undesired cross-talk induced by the optical damage may be achieved by optimizing the shapes of the tapered couplers
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