Abstract

A significant phenomenon associated with devices used in nano/microelectromechanical systems (N/MEMS) is the dynamic pull-in instability. The basic theme of this manuscript is to study the nonlinear oscillation and dynamic pull-in instability in an N/MEMS switch with a current carrying conductor due to magnetic force. The variational iteration method accompanied by the techniques of the Laplace transform is used to find the approximate nonlinear frequency and approximate analytic solution of the model problem. The critical condition for the pull-in threshold is successfully obtained, which is extremely useful for the optimal design of N/MEMS. The effects of parameters on the frequency and the solution are discussed as well. The present findings exceptionally agree with the numerical results obtained by the Runge-Kutta method of order four and also give better accuracy when compared to other methods.

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