Abstract
It has been noted that signal aperture radar (SAR) imagery of clutter exhibits Rayleigh multiplicative noise due to speckle. We use a database of MSTAR target chips to verify that the noise is multiplicative rather than additive for all regions in the chip. Then, by examining histograms corresponding to the noise residuals, we show that a Weibull distribution that is almost Rayleigh best fits the data. However, when we restrict the analysis over the target region, the log-normal and Rayleigh models fit the noise equally as well. This can be attributed to scattering mechanisms that are unstable over five degrees of aspect angle.
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