Analysis of Multipactor Effects by a Particle-in-Cell Algorithm Coupled with the Furman-Pivi Secondary Electron Emission Model

Abstract

We investigate multipactor effects due to secondary electron emission (SEE) using an electromagnetic particle-in-cell (EM-PIC) algorithm implemented on unstructured grids with the Furman-Pivi probabilistic SEE model. The present EMPIC algorithm yields an energy- and charge-conserving time-update for fields and particles on unstructured grids, from first principles. The Furman-Pivi model enables a realistic description of SEE in EM-PIC simulations. We study the effects of the surface roughness for the reduction of secondary electron yield (SEY) on copper surfaces.