Abstract

Electrical transport in bulk samples of HgTe was studied using the recently developed mobility spectrum technique to interpret magnetic‐field‐dependent Hall measurements. Hole mobilities in excess of 105 cm2/V s were observed in pure samples at 4–16 K. In more highly doped samples, four types of carriers were observed: high‐mobility electrons (≊105 cm2/V s), high‐mobility holes (≊104 cm2/V s), and low‐mobility electrons and holes (≊103 cm2/V s). The physical implications of the results are discussed.

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