Abstract
Photothermal reflectance microscopy was applied to the analysis of local thermal diffusivity on tape-cast AlN ceramics. The materials were obtained from three different commercial powders, two sintering temperatures (1750 and 1800 °C), and 3 wt % Y2O3 sintering aid. Owing to the high spatial resolution of the technique (∼30 μm in the present case), measurements in different positions on the sample surface were carried out. In this way a study of the homogeneity of thermal properties was performed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
