Analysis of indentation size effect (ISE) in nanoindentation hardness in polycrystalline PMN-PT piezoceramics with different domain configurations

Abstract

Piezoelectric materials contain microstructural features (e.g., domain walls, interdomain spacing, and grain size) that span across several length scales, i.e., few nm in the case of interdomain wall spacing to several μm in case grain sizes. Recent experimental findings indicated that the domain configurations have more influence on the hardness of these materials than the grain size. In this study, nanoindentation experiments are conducted on polycrystalline PMN-PT (a relaxor ferroelectric material) with a focus to investigate the influence of domain configurations on the indentation size effect (ISE) in hardness, H. Different domain configurations are achieved by selectively annealing the as poled samples above and below the Curie temperature. Nanoindentation hardness is obtained in the load range of 1–5 mN with the maximum penetration depth well below the grain size of the samples. The experimental results reveal that all the samples, albeit to a different order, exhibit strong Reverse Indentation Size Effect (RISE) and normal ISE in H. The observed ISE is then analyzed using classical Meyer's law, the proportional specimen resistance (PSR) model and modified PSR (mPSR) model. The critical analysis of nanoindentation data reveals that the PSR model provides a satisfactory understanding of the genesis of RISE and ISE considering the elastic resistance of test material and frictional resistance at indenter facet/test material.