Analysis of human blood serum and human brain samples by total reflection X-ray fluorescence spectrometry applying Compton peak standardization

Abstract

The method of using the Compton peak as internal standard in total reflection X-ray fluorescence (TXRF) determination is established for trace element determination of Fe, Cu, Zn, Se and Pt in human serum and of Cu and Zn in homogenized brain samples. A new method of spectrometer sensitivity calibration using spiked matrices with known amounts of trace elements is tested against established methods of matrix matching as well as internal element addition. The analytical results with the proposed procedure are compared to a certified international standard and to values with Atomic Absorption Spectrometry (AAS) obtaining analytical results of comparable accuracy and precision. The method is adequate for routine clinical analysis as it has the advantages of requiring very small amounts of material and simple preparations, which avoids the chemical digestion stage.