Abstract
This paper presents a detailed analysis of high-performance edge-triggered memory elements for deep submicron mixed-signal applications. The variations of the main parameters (power, delay, peak of supply current) with supply voltage, as well as timing restrictions have been studied. Especial emphasis has been given to switching-noise generation, an aspect of important concern in mixed-signal applications. We have analyzed the sources of switching noise, noticing that, the less noisy flip-flops are those based on differential structures.
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