Abstract
He-implanted samples of LiNbO3 have been analyzed by 24-MeV 28Si elastic recoil detection. For 50-keV He implants, the Li and H profiles show a depletion of Li from the sample near-surface region which coincides with a gain of H. The Li loss is seen to increase with increasing ion fluence and implantation temperature.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.