Abstract

The field distribution inside the symmetric transverse electromagnetic (TEM) cell is analyzed by finite element method (FEM). Poisson's equation is solved to obtain the potential distribution in the cross section. The horizontal and vertical components of the electric field are computed from the gradient of the solution. The field variation below the septum are computed and their variations are plotted. The uniform region of the vertical component of electric field is found and isolation of the horizontal component of electric field is determined.. This proves that in the region below the septum the TEM cell supports uniform transverse electromagnetic (TEM) field, which is a requirement for testing the susceptibility levels of electronic equipment.

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