Abstract

Reliable and predictable operation of power electronics is of increasing importance due to continuously growing penetration of such systems in industrial applications. This article focuses on the fault-tolerant operation of the bidirectional secondary-modulated current-source DC–DC converter. The study analyzes possible topology reconfigurations in case an open- or short-circuit condition occurs in one of the semiconductor devices. In addition, multi-mode operation based on topology-morphing is evaluated to extend the operating range of the case study topology. The influence of post-failure modes on the functionality and performance is analyzed with a 300 W converter prototype. It is demonstrated that failure of one transistor in the current-source side can be mitigated without dramatic loss in the efficiency at maximum power, while preserving bidirectional operation capability.

Highlights

  • Increased dependability on power electronic systems in various application areas has made their reliable operation over their designed lifetime an essential factor

  • For the insulated-gate bipolar transistors (IGBTs), the avalanche ruggedness is smaller than the SC one due to high currents forming around the edge of the device and can vary significantly, depending on the device type and configuration [15,16,17]

  • To validate the analysis from the previous section, a converter prototype according to the topology

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Summary

Introduction

Increased dependability on power electronic systems in various application areas has made their reliable operation over their designed lifetime an essential factor. Normal operation depends on a high number of fragile components, while failure in one of those can lead to loss of functionality, increased downtime, and maintenance costs. The bidirectional of semiconductor devicesDC–DC allows converter us to takeon advantage of the different reconfiguration possibilities and full-bridge current-source the basis of topology presented in [11]. Current-source converters are inherently fault tolerant of semiconductor devices allows us to take advantage of different reconfiguration possibilities and to internal and post-failure external short circuitsmodes. Address various operation converters inherently fault tolerant after a failure, the topology can be reconfigured into another one with a simplified structure.

Description of Topology
Analyzed
Failure Detection Methods
Reconfiguration
Acceptable
Multi-Mode Operation Strategy
Converter Design Specifications
Determination of Mode Boundary
Post-Failure Operation and Performance
Operating
Multi-Mode Control
The estimated and experimentally obtained prototype are depicted in
11. Operation
Conclusions
Full Text
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