Analysis of Facet Temperature Distribution of Semiconductor Lasers

Abstract

In this paper catastrophic optical mirror damage(COMD) mechanism of the semiconductor laser is analyzed. COMD is one of major device damage mechanisms, which is drastically limited laser lifetime and output optical power. The theoretical model that based on heat source with injection current and optical power to describe the temperature distribution of laser is builded. Through analyzing the edge-emitting semiconductor lasers by using ANSYS, we can describe change of facet temperature distribution at COMD events. the results of simulation show that the main reason of COMD is oxidation of the semiconductor laser in facet which caused by optical absorption. Introduction Nowadays, high-power semiconductor lasers have been widely used in the broad field of science. It is important that the reliability of lasers. COMD process is one of the major mechanisms, which drastically limits laser lifetime and emits optical output power. So, its emphasis of study is how to avoiding the COMD of device-cavity surface. For the majority of high power laser, COMD phenomenon of the facet surface induces high optical power density which limits the maximum power of the device, and affects the reliability of the device lifetime [1]. So, in the beginning of the theoretical design of devices, it should analysis simulation of facet temperature to determine the COD threshold of the device. Especially, it is important that improves the reliability of high power lasers. It is necessary that simulation of facet temperature distribution. And it also provides a reference which can improve process of cavity surface and the COMD threshold. Semiconductor lasers are basically made of a gain section between two facets. When a laser is driven into higher output powers, the facet regions absorb light, hence making the facets hot, and provoking a “thermal runaway” system and eventually irreversible laser destruction [2]. It is so called catastrophic optical damage COMD, and it is characterized by a sudden drop in the output power at a certain maximum injection current.