Abstract
In this work, based on the use of ITO as a defect, we study the infrared defect mode in defective photonic crystal made of SiO2 and InP. Due to the dispersion in the dielectric function of ITO, it is found that the defect mode is sensitive to the ITO thickness. The defect frequency is shown to be blue-shifted as the thickness of ITO decreases. In the angular dependence of defect mode, it is seen that the defect frequency is also blue-shifted when the angle of incidence increases for both TE and TM polarizations. However, the shifting feature is appeared to be nearly polarization-independent. The shift in the defect frequency enables us to employ ITO as a tunable agent in order to design a tunable photonic crystal filter in the infrared region.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
