Abstract
A completely shielded dielectric resonator (DR) structure consisting of a DR placed on a dielectric substrate is considered. This configuration is compared with one that has a very-low-dielectric-constant spacer. Particularly, the coupling coefficient between the DR and the microstrip line is analyzed and evaluated by using the mode-matching technique, which is based on dividing the resonator structure into partial regions and regarding them as sections of dielectrically loaded waveguides. The propagation constants are found by solving the resulting transcendental equation by enforcing the continuity of the tangential field components inside each partial region and the condition of vanishing tangential electric field on the metallic enclosure. The numerical evaluation of the coupling is obtained for different DR materials and different substrate thicknesses. The electric field distributions inside the structure with and without the space are also evaluated and compared. >
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