Abstract
The inset dielectric guide (IDG) represents an easy-to-fabricate alternative to the image line that is also less sensitive to loss radiation at discontinuities. Two IDG geometries were analyzed, the so-called deep and shallow IDG structures, operating in the LSE and LSM polarizations, respectively. The propagation constants of single and coupled symmetrical IDGs have been calculated as well as the coupling coefficients of coupled guides. The transverse resonance diffraction method with variational formulation was used. Measured values show very good agreement with predicted values for the propagation constants of coupled deep slot IDGs. The information is a prerequisite for the design of directional couplers in IDG.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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